1. High resolution X-ray diffractometry and topography
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : X-ray crystallography.,X-rays- Diffraction.,Crystals
رده :
QD945
.
B683
1998
2. High resolution X-ray diffractometry and topography
پدیدآورنده : / D. Keith Bowen and Brian K. Tanner
کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)
موضوع : X-ray crystallography.,X-rays--Diffraction,Crystals.
رده :
QD
,
945
,.
B683
,
1998
3. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors--Design and construction--Quality control,Integrated circuits--Measurement,Semiconductor wafers--Inspection,X-rays--Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
4. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
موضوع : Semiconductors- Design and construction- Quality control,Integrated circuits- Measurement,Semiconductor wafers- Inspection,X-rays- Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
5. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy
رده :
E-BOOK
